Please use this identifier to cite or link to this item: http://hdl.handle.net/20.500.11960/3049
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dc.contributor.authorGomes, Eduarda-
dc.contributor.authorFigueiredo, F. M.-
dc.contributor.authorMarques, F. M. B.-
dc.date.accessioned2022-12-29T15:18:24Z-
dc.date.available2022-12-29T15:18:24Z-
dc.date.issued2008-
dc.identifier.citationGomes, E., Figueiredo, F. M., & Marques, F. M. B. (2008). Grain boundary Fe-doping effects in LSGM. Solid State Ionics, 179(21-26), 900-903. https://doi.org/10.1016/j.ssi.2008.01.057pt_PT
dc.identifier.issn0167-2738-
dc.identifier.urihttp://hdl.handle.net/20.500.11960/3049-
dc.description.abstractThe electrical properties of La0.95Sr0.05Ga0.90Mg0.10O3 − δ (LSGM) were modified by selective doping of the grain boundaries, using LaFeO3 screen-printed layers and annealing at high temperature to promote Fe diffusion into LSGM. Scanning electron microscopy (SEM) and energydispersive spectroscopy (EDS) analyses showed that iron was mainly located along the grain boundaries with the bulk grain composition almost unchanged. Impedance spectra showed a significant increase in the total conductivity for the Fe-doped samples, the effect being greater for the grain boundary contribution. The formation of a parallel pathway for electronic conduction along the grain boundaries explains these effects. Ageing of these samples at high temperature, after removal of the Fe source, showed a steady shift to the original LSGM behaviour, due to dilution of Fe throughout the samples.pt_PT
dc.language.isoengpt_PT
dc.rightsopenAccesspt_PT
dc.subjectLanthanum gallatept_PT
dc.subjectGrain boundarypt_PT
dc.subjectMixed conductorpt_PT
dc.subjectImpedance spectroscopypt_PT
dc.titleGrain boundary Fe-doping effects in LSGMpt_PT
dc.typearticlept_PT
dc.date.updated2022-12-05T11:31:46Z-
dc.description.version371C-9F16-EBDE | Eduarda Gomes-
dc.description.versionN/A-
dc.identifier.slugcv-prod-93955-
dc.peerreviewedyespt_PT
degois.publication.firstPage900pt_PT
degois.publication.lastPage903pt_PT
degois.publication.volume179pt_PT
degois.publication.issue21-26pt_PT
degois.publication.titleSolid State Ionicspt_PT
dc.identifier.doi10.1016/j.ssi.2008.01.057-
dc.identifier.eid2-s2.0-48349110965-
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